Mtengo wofunikira wa chinyezi mu chipinda choyera cha semiconductor (FAB) ndi pafupifupi 30 mpaka 50%, zomwe zimalola malire ang'onoang'ono a zolakwika za ± 1%, monga zone ya lithography - kapena kucheperapo mu far ultraviolet processing (DUV) zone - pomwe kwina akhoza kumasuka ku ± 5%. Chifukwa...
Ku United States, mpaka kumapeto kwa November 2001, Federal Standard 209E (FED-STD-209E) inagwiritsidwa ntchito kufotokoza zofunikira pazipinda zaukhondo. Pa November 29, 2001, miyezo imeneyi inasinthidwa ndi kusindikizidwa kwa ISO Specification 14644-1. Nthawi zambiri, chipinda choyera chimagwiritsidwa ntchito ...